Description : Describes this process at it relates to the electronics industry, focusing on such areas as printed wiring boards, networking, automatic assembly, surface mount technology, tape automated bonding, bar coding, and electro-static discharge. Also studies the effects of group work ethics as a factor in
Description : Illustrates recently developed fixture design and verification technology, focusing on their central role in manufacturing processes. The text uses up-to-date computer technology to minimize costs, increase productivity and assure product quality. It presents advanced data and analysis that is directly applicable to development of comprehensive computer-aided modular fixture design system.
Description : Design of Work and Development of Personnel in Advanced Manufacturing explains the urgent need for explicit philosophical acceptance of the vital importance of human work design and development of human resources in advanced manufacturing
Description : Design has now become an important research topic in engineering and architecture. Design is one of the keystones to economic competitiveness and the fundamental precursor to manufacturing. The development of computational models founded on the artificial intelligence paradigm has provided an impetus for current design research. This volume contains contributions from the Second International Conference on Artificial Intelligence in Design held in June 1992 in Pittsburgh. They represent the state-of-the-art and the cutting edge of research and development in this field. They are of particular interest to researchers, developers and users of computer systems in design. This volume demonstrates both the breadth and depth of artificial intelligence in design and points the way forward for our understanding of design as a process and for the development of computer-based tools to aiddesigners.
Description : DEFECT PROPORTION OF DETECTION INITIAL RATE DETECTION RATE INSPECTOR 3 COMPLEXITY OF TIMES PAN OF PERFORMING o~ ________________________ o~ ______________________ __ -;. INSPECTION TASK -;. VISUAL INSPECTION Fagure 1. Trends in relations between the complexity of inspection tasks, defect detection rates (absolute and relative), and inspection time. Irrespective of the necessities described above, and with the excep tion of specific generic application systems (e.g., bare-board PCB inspection, wafer inspection, solder joint inspection, linewidth measure ment), vision systems are still not found frequently in today's electronics factories. Besides cost, some major reasons for this absence are: 1. The detection robustness or accuracy is still insufficient. 2. The total inspection time is often too high, although this can frequently be attributed to mechanical handling or sensing. 3. There are persistent gaps among process engineers, CAD en gineers, manufacturing engineers, test specialists, and computer vision specialists, as problems dominate the day-to-day interac tions and prevent the establishment of trust. 4. Computer vision specialists sometimes still believe that their contributions are universal, so that adaptation to each real problem becomes tedious, or stumbles over the insufficient availabIlity of multidisciplinary expertise. Whether we like it or not, we must still use appropriate sensors, lighting, and combina tions of algorithms for each class of applications; likewise, we cannot design mechanical handling, illumination, and sensing in isolation from each other.
Description : Since John Bosch edited and published the first version of this book in 1995, the world of manufacturing and coordinate measuring machines (CMMs) and coordinate measuring systems (CMSs) has changed considerably. However, the basic physics of the machines has not changed in essence but have become more deeply understood. Completely revised and updated to reflect the change that have taken place in the last sixteen years, Coordinate Measuring Machines and Systems, Second Edition covers the evolution of measurements and development of standards, the use of CMMs, probing systems, algorithms and filters, performance and financial evaluations, and accuracy. See What’s New in the Second Edition: Explores the rising expectations of the user for operator interfaces, ease of use, algorithms, speed, communications, and computational capabilities Details the expansion of machines such as the non-Cartesian CMM in market share and their increase in accuracy and utility Discusses changes in probing systems, and the number of points they can deliver to ever more sophisticated software Examines the pressures created by new applications to improve machine performance The book features two new editors, one from academia and one from a metrology intensive user industry, many new authors, and known experts who have grown with the field since the last version. Furnishing case studies from a wide range of installations, the book details how CMMs can best be applied to gain a competitive advantage in a variety of business settings.
Description : Grinding offers capabilities that range from high-rate material removal to high-precision superfinishing, and has become one of the most widely used industrial machining and surface finishing operations. Reflecting modern developments in the science and practice of modern grinding processes, the Handbook of Machining with Grinding Wheels presents a
Description : A practical guide to incorporating computer-integrated testing (CIT) procedures into a computer-integrated manufacturing (CIM) line. Surveys the latest automated test equipment (ATE) and discusses how to integrate ATE into CIM in order to maximize benefits. Contains case studies in CIT, focusing on applications in the electronics industry.
Description : The Electronics and Electrical Engineering Laboratory (EEEL), working in concert with other NIST Laboratories, is providing measurement and other generic technology critical to the competitiveness of the U.S. electronics industry and the U.S. electricity-equipment industry. This report summarizes selected technical accomplishments and describes activities conducted by the Lab in FY 1998. Also included are profiles of EEEL's organization, customer interactions, and long-term goals. Appendix includes crosswalk of EEEL programs and projects; EEEL FY1998 resources; EEEL FY1998 CRADAS; and EEEL organization chart.