Description : Provides in-depth knowledge on novel materials that make electronics work under high-temperature and high-pressure conditions This book reviews the state of the art in research and development of lead-free interconnect materials for electronic packaging technology. It identifies the technical barriers to the development and manufacture of high-temperature interconnect materials to investigate into the complexities introduced by harsh conditions. It teaches the techniques adopted and the possible alternatives of interconnect materials to cope with the impacts of extreme temperatures for implementing at industrial scale. The book also examines the application of nanomaterials, current trends within the topic area, and the potential environmental impacts of material usage. Written by world-renowned experts from academia and industry, Harsh Environment Electronics: Interconnect Materials and Performance Assessment covers interconnect materials based on silver, gold, and zinc alloys as well as advanced approaches utilizing polymers and nanomaterials in the first section. The second part is devoted to the performance assessment of the different interconnect materials and their respective environmental impact. -Takes a scientific approach to analyzing and addressing the issues related to interconnect materials involved in high temperature electronics -Reviews all relevant materials used in interconnect technology as well as alternative approaches otherwise neglected in other literature -Highlights emergent research and theoretical concepts in the implementation of different materials in soldering and die-attach applications -Covers wide-bandgap semiconductor device technologies for high temperature and harsh environment applications, transient liquid phase bonding, glass frit based die attach solution for harsh environment, and more -A pivotal reference for professionals, engineers, students, and researchers Harsh Environment Electronics: Interconnect Materials and Performance Assessment is aimed at materials scientists, electrical engineers, and semiconductor physicists, and treats this specialized topic with breadth and depth.
Description : Production planning, inventory management, quality control, and maintenance policy are critical components of the manufacturing system. The effective integration of these four components gives a manufacturing operation the competitive edge in today's global market place. Integrated Models in Production Planning, Inventory, Quality, and Maintenance provides, in one volume, the latest developments in the integration of production, quality, and maintenance models. Prominent researchers, who are actively engaged in these areas, have contributed the topical chapters focused on the most recent issues in the area. In Part I, Ben-Daya and Rahim provide an overview of the literature dealing with integrated models for production, quality, and maintenance. Directions for future research are outlined. Part II contains six chapters (chapters 2 to 6) dealing with integrated models for production and maintenance. Part III deals with integrated production/inventory and quality models in chapters 7-11. Part IV focuses on quality and maintenance integrated models and contains two chapters. Part V deals with warranty, manufacturing, and quality and contains two chapters. Part VI addresses issues related to quality and contains three chapters (chapters 16-18).
Description : Advances in Manufacturing Technology XVII continues a well-respected series with the papers presented at the 1st International Conference on Manufacturing Research (ICMR 2003) - incorporating the 19th National Conference on Manufacturing Research (NCMR). This essential text provides a thorough review of all aspects of manufacturing engineering and management and will be of interest to all those involved in this rapidly advancing sphere of mechanical and manufacturing engineering. Topics covered include Machining Processes and Tooling Forming Processes and Tools Advanced Manufacturing Techniques Advanced Manufacturing Systems Design Methods, Processes, and Systems CAD/CAM Testing/Experimentation/Metrology Internet and E-design/Manufacture Virtual Enterprise and Enterprise Integration
Description : The main reason for the premature breakdown of today's electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. Today professionals are looking for effective ways to minimize the degradation of electronic components to help ensure longer-lasting, more technically sound products and systems. This practical book offers engineers specific guidance on how to design more reliable components and build more reliable electronic systems. Professionals learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for the intended applications. Moreover, the book helps system designers ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure.
Description : The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading. Particular attention will be given to portable devices and systems designed for operation in harsh environments (such as automotive, aerospace, military, etc.) In-depth discussion from a mechanical engineer's viewpoint will be conducted to the key components’ level as well as the whole device level. Both theoretical (analytical and computer-aided) and experimental methods of analysis will be addressed. The authors will identify how the failure control parameters (e.g. displacement, strain and stress) of the vulnerable components may be affected by the external vibration or shock loading, as well as by the internal parameters of the infrastructure of the device. Guidelines for material selection, effective protection and test methods will be developed for engineering practice.